Control of design specific variation in etch-assisted via pattern transfer by means of full-chip simulation. - Valeriy Sukharev; Ara Markosian; Armen Kteyan; Levon Manukyan; Nikolay Khachatryan; Jun-Ho Choy; Hasmik Lazaryan; Henrik Hovsepyan; Seiji Onoue; Takuo Kikuchi; Tetsuya Kamigaki (ISQED, 2009)

Multi-scale Simulation Methodology for Stress Assessment in 3D IC: Effect of Die Stacking on Device Performance. - Valeriy Sukharev; Armen Kteyan; Jun-Ho Choy; Henrik Hovsepyan; Ara Markosian; Ehrenfried Zschech; Rene Huebner (J. Electron. Test., 2012)