Process reliability based trojans through NBTI and HCI effects. - Yuriy Shiyanovskii; Francis G. Wolff; Aravind Rajendran; Christos A. Papachristou; Daniel J. Weyer; W. Clay (AHS, 2010)

Noise margin, critical charge and power-delay tradeoffs for SRAM design. - Aravind Rajendran; Yuriy Shiyanovskii; Frank Wolff; Christos A. Papachristou (IOLTS, 2011)

A novel radiation tolerant SRAM design based on synergetic functional component separation for nanoscale CMOS. - Yuriy Shiyanovskii; Aravind Rajendran; Christos A. Papachristou (IOLTS, 2011)

A low power memory cell design for SEU protection against radiation effects. - Yuriy Shiyanovskii; Aravind Rajendran; Christos A. Papachristou (AHS, 2012)