Runway assessment via remote sensing. - Lalitha Dabbiru; Pan Wei; Archit Harsh; Julie White; John E. Ball; James V. Aanstoos; Patrick Donohoe; Jesse Doyle; Sam Jackson; John Newman (AIPR, 2015)

Measuring conflict in a multi-source environment as a normal measure. - Pan Wei; John E. Ball; Derek T. Anderson; Archit Harsh; Christopher Archibald (CAMSAP, 2015)

Onion-Peeling Outlier Detection in 2-D data Sets. - Archit Harsh; John E. Ball; Pan Wei (CoRR, 2018)