Impact of electrode surface modulation on time-dependent dielectric breakdown. - Kong Boon Yeap; Tian Shen; Galor Wenyi Zhang; Sing Fui Yap; Brian Holt; Arfa Gondal; Seungman Choi; San Leong Liew; Walter Yao; Patrick Justison (IRPS, 2015)

HCI Improvement on 14nm FinFET IO Device by Optimization of 3D Junction Profile. - Xinggon Wan; Baofu Zhu; Meera Mohan; Keija Wu; Dongil Choi; Arfa Gondal (IRPS, 2019)