Design and Performance Analysis of the Exponentially Weighted Moving Average Mean Estimate for Processes Subject to Random Step Changes. - Argon Chen; Elsayed A. Elsayed (Technometrics, 2002)

Optimal sampling in design of experiment for simulation-based stochastic optimization. - Mark W. Brantley; Loo Hay Lee; Chun-Hung Chen; Argon Chen (CASE, 2008)

Optimum sampling for track PEB CD Integrated Metrology. - Argon Chen; Sean Hsueh; Jakey Blue (CASE, 2009)

Spatial Variance Spectrum Analysis and Its Application to Unsupervised Detection of Systematic Wafer Spatial Variations. - Jakey Blue; Argon Chen (IEEE Trans Autom. Sci. Eng., 2011)

Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis. - Amos Hong; Argon Chen (WSC, 2012)

A variance-reduction method for thyroid nodule boundary detection on ultrasound images. - Ling-Ying Chiu; Argon Chen (CASE, 2014)

Applications of quantitative methods in semiconductor manufacturing. - Lars Mönch; Argon Chen; Myoungsoo (Andy) Ham; James Morrison (Comput. Oper. Res., 2015)

Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing. - Hamideh Rostami; Jakey Blue; Argon Chen; Claude Yugma (CASE, 2018)

Classification Tree with Hybrid Splitting Mechanism. - Huanze Zeng; Argon Chen (SISY, 2019)

Comprehensive relative importance analysis and its applications to high dimensional gene expression data analysis. - Zixin Shen; Argon Chen (Knowl. Based Syst., 2020)

Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters. - Zixin Shen; Amos Hong; Argon Chen (Adv. Eng. Informatics, 2021)

Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing. - Hamideh Rostami; Jakey Blue; Argon Chen; Claude Yugma (Int. J. Intell. Syst., 2021)

Binary multi-layer classifier. - Huanze Zeng; Argon Chen (Inf. Sci., 2021)

Multivariate multi-layer classifier. - Huanze Zeng; Argon Chen (Pattern Recognit., 2022)