Effects of hot carriers in offset gated polysilicon thin-film transistors. - Argyrios T. Hatzopoulos; Dimitrios H. Tassis; N. Arpatzanis; C. A. Dimitriadis; G. Kamarinos (Microelectron. Reliab., 2006)

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors. - Dimitrios H. Tassis; Argyrios T. Hatzopoulos; N. Arpatzanis; C. A. Dimitriadis; G. Kamarinos (Microelectron. Reliab., 2006)

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress. - N. Arpatzanis; Argyrios T. Hatzopoulos; Dimitrios H. Tassis; C. A. Dimitriadis; François Templier; Maher Oudwan; G. Kamarinos (Microelectron. Reliab., 2008)

Web-Based Monitoring of Refrigerator Units Using Microcontroller. - Nikolaos Chatzilabrou; Kyriakos Koritsoglou; Aikaterini I. Griva; Vassilios D. Vassios; Kyriakos Tsiakmakis; Achilles D. Boursianis; Argyrios T. Hatzopoulos; Sotirios K. Goudos; Maria S. Papadopoulou (MOCAST, 2024)

Liquid Filling Measuring System with Variable Flow. - Nikisanlis Nikolaos; Argyrios T. Hatzopoulos; Vassilios D. Vassios; Vasileios Delimaras; Kyriakos Tsiakmakis; Maria S. Papadopoulou (MOCAST, 2024)

Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation. - Vassilios D. Vassios; Argyrios T. Hatzopoulos; Ioannis G. Intzes; Dimitrios K. Papakostas (MOCAST, 2024)

Design and Development of a Low-Cost Circuit for Soil Electrical Conductivity Measurement Using the Wenner Array Method. - Vasileios D. Koufogeorgos; Argyrios T. Hatzopoulos; Kyriakos Tsiakmakis; Vasileios Vassios; Maria S. Papadopoulou; Dimitrios K. Papakostas (MOCAST, 2025)

Integrated IoT and AI-Driven Smart Refrigerator System. - Dimitrios Toliopoulos; Efthimios Demkas; Argyrios T. Hatzopoulos; Kyriakos Tsiakmakis; Achilles D. Boursianis; Spyridon Nikolaidis 001; Sotirios K. Goudos; Maria S. Papadopoulou (MOCAST, 2025)

A Self-Trained, Low-Complexity Method for Detecting Faults in Analog Circuits. - Vassilios D. Vassios; Argyrios T. Hatzopoulos; Ioannis G. Intzes; Kyriakos Tsiakmakis; Dimitrios K. Papakostas (IEEE Trans. Instrum. Meas., 2025)