Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS. - Loukas Chevas; Aristeidis Nikolaou; Matthias Bucher; Nikolaos Makris; Alexia Papadopoulou; Apostolos Zografos; Giulio Borghello; Henri D. Koch; Federico Faccio (MIXDES, 2018)

Extending a 65nm CMOS process design kit for high total ionizing dose effects. - Aristeidis Nikolaou; Matthias Bucher; Nikos Makris; Alexia Papadopoulou; Loukas Chevas; Giulio Borghello; Henri D. Koch; Kostas Kloukinas; Tuomas S. Poikela; Federico Faccio (MOCAST, 2018)

FOSS EKV2.6 Verilog-A Compact MOSFET Model. - Wladek Grabinski; Ahmed Abo-Elhadid; Marek Mierzwinski; Laurent Lemaitre; Mike Brinson; Christophe Lallement; Jean-Michel Sallese; Sadayuki Yoshitomi; Paul Malisse; Henri Oguey; Stefan Cserveny; Marcelo Antonio Pavanello; et al. (ESSDERC, 2019)

Forward and Reverse Operation of Enclosed-Gate MOSFETs and Sensitivity to High Total Ionizing Dose. - Aristeidis Nikolaou; Loukas Chevas; Alexia Papadopoulou; Nikolaos Makris; Matthias Bucher; Giulio Borghello; Federico Faccio (MIXDES, 2019)

Design of Micropower Operational Transconductance Amplifiers for High Total Ionizing Dose Effects. - Alexia Papadopoulou; Nikolaos Makris; Loukas Chevas; Aristeidis Nikolaou; Matthias Bucher (MOCAST, 2019)

Variability-Aware Characterization of Current Mirrors Based on Organic Thin-Film Transistors on Flexible Substrates. - Aristeidis Nikolaou; Jakob Leise; Jakob Pruefer; Ute Zschieschang; Hagen Klauk; Ghader Darbandy; Benjamín Iñíguez; Alexander Kloes (MIXDES, 2021)

Impact of Mechanical Bending on the Performance of Organic Thin-Film Transistors and the Characteristic Temperature of the Density of States. - Aristeidis Nikolaou; Jakob Leise; Jakob Pruefer; Ute Zschieschang; Hagen Klauk; Ghader Darbandy; Benjamín Iñíguez; Alexander Kloes (MIXDES, 2022)