Localization of FET Device Performance with Thermal Laser Stimulation. - Sanjib Kumar Brahma; Christian Boit; Arkadiusz Glowacki; Hiroyoshi Suzuki (Microelectron. Reliab., 2004)

Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout. - Sanjib Kumar Brahma; Christian Boit; Arkadiusz Glowacki (Microelectron. Reliab., 2005)

Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits. - Piotr Laskowski; Arkadiusz Glowacki; Christian Boit (Microelectron. Reliab., 2008)

Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures. - Arkadiusz Glowacki; Piotr Laskowski; Christian Boit; Ponky Ivo; Eldad Bahat-Treidel; Reza Pazirandeh; Richard Lossy; Joachim Würfl; Günther Tränkle (Microelectron. Reliab., 2009)

Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation. - Sanjib Kumar Brahma; Arkadiusz Glowacki; Reiner Leihkauf; Christian Boit (Microelectron. Reliab., 2011)

Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning. - Arkadiusz Glowacki; Christian Boit; Philippe Perdu (Microelectron. Reliab., 2011)

Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements. - Ponky Ivo; Arkadiusz Glowacki; Eldad Bahat-Treidel; Richard Lossy; Joachim Würfl; Christian Boit; Günther Tränkle (Microelectron. Reliab., 2011)

Optimum Si thickness for backside detection of photon emission using Si-CCD. - Arkadiusz Glowacki; Christian Boit; Philippe Perdu (Microelectron. Reliab., 2012)

Comparison of FET electro-optical modulation for 1300 nm and 1064 nm laser sources. - Carlo Pagano; Christian Boit; Arkadiusz Glowacki; Reiner Leihkauf; Yoshiyuki Yokoyama (Microelectron. Reliab., 2012)

Backside spectroscopic photon emission microscopy using intensified silicon CCD. - Arkadiusz Glowacki; Christian Boit; Philippe Perdu; Yoshitaka Iwaki (Microelectron. Reliab., 2014)

New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery. - Ponky Ivo; Eunjung Melanie Cho; Przemyslaw Kotara; Lars Schellhase; Richard Lossy; Ute Zeimer; Anna Mogilatenko; Joachim Würfl; Günther Tränkle; Arkadiusz Glowacki; Christian Boit (Microelectron. Reliab., 2014)