Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. - Arman Vassighi; Oleg Semenov; Manoj Sachdev; Ali Keshavarzi (DFT, 2002)

Thermal Management of High Performance Microprocessors. - Arman Vassighi; Oleg Semenov; Manoj Sachdev; Ali Keshavarzi (DFT, 2003)

Burn-in Temperature Projections for Deep Sub-micron Technologies. - Oleg Semenov; Arman Vassighi; Manoj Sachdev; Ali Keshavarzi; Charles F. Hawkins (ITC, 2003)

Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing. - Oleg Semenov; Arman Vassighi; Manoj Sachdev (J. Electron. Test., 2003)

Design optimizations for microprocessors at low temperature. - Arman Vassighi; Ali Keshavarzi; Siva G. Narendra; Gerhard Schrom; Yibin Ye; Seri Lee; Greg Chrysler; Manoj Sachdev; Vivek De (DAC, 2004)

Thermal and Power Management of Integrated Circuits - Arman Vassighi; Manoj Sachdev (Springer, 2006)