Probe-based ultrahigh-density storage technology. - Aggeliki Pantazi; Abu Sebastian; Theodore Antonakopoulos 001; Peter Bächtold; Anthony R. Bonaccio; Jose Bonan; Giovanni Cherubini; Michel Despont; Richard A. DiPietro; Ute Drechsler; Urs Dürig; Bernd Gotsmann; et al. (IBM J. Res. Dev., 2008)

Nanometer control of the markerless overlay process using thermal scanning probe lithography. - Colin Rawlings; Urs Dürig; James L. Hedrick; Dan Coady; Armin Knoll (AIM, 2014)