New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. - Nabil El Belghiti Alaoui; Patrick Tounsi; Alexandre Boyer; Arnaud Viard (NATW, 2018)

Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis. - Nabil El Belghiti Alaoui; Alexandre Boyer; Patrick Tounsi; Arnaud Viard (J. Electron. Test., 2018)

New defect detection approach using near electromagnetic field probing of high density PCBAs. - Nabil El Belghiti Alaoui; Alexandre Boyer; Patrick Tounsi; Arnaud Viard (Microelectron. Reliab., 2018)

Detecting PCB Assembly Defects Using Infrared Thermal Signatures. - Nabil El Belghiti Alaoui; Patrick Tounsi; Alexandre Boyer; Arnaud Viard (MIXDES, 2019)