Temperature dependent substrate trapping in AlGaN/GaN power devices and the impact on dynamic ron. - Arno Stockman; Michael J. Uren; Alaleh Tajalli; Matteo Meneghini; Benoit Bakeroot; Peter Moens (ESSDERC, 2017)

On the origin of the leakage current in p-gate AlGaN/GaN HEMTs. - Arno Stockman; Eleonora Canato; Alaleh Tajalli; Matteo Meneghini; Gaudenzio Meneghesso; Enrico Zanoni; Peter Moens; Benoit Bakeroot (IRPS, 2018)

Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors. - Alaleh Tajalli; Eleonora Canato; Arianna Nardo; Matteo Meneghini; Arno Stockman; Peter Moens; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2018)

µs-Range Evaluation of Threshold Voltage Instabilities of GaN-on-Si HEMTs with p-GaN Gate. - Eleonora Canato; Fabrizio Masin; Matteo Borga; Enrico Zanoni; Matteo Meneghini; Gaudenzio Meneghesso; Arno Stockman; Abhishek Banerjee 003; Peter Moens (IRPS, 2019)

A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability. - Peter Moens; Arno Stockman (IRPS, 2019)

Charge Trapping and Stability of E-Mode p-gate GaN HEMTs Under Soft- and Hard- Switching Conditions. - Fabrizio Masin; Matteo Meneghini; Eleonora Canato; Alessandro Barbato; Carlo De Santi; Arno Stockman; Abhishek Banerjee 003; Peter Moens; Enrico Zanoni; Gaudenzio Meneghesso (IRPS, 2020)

Analysis and Modeling of Vth Shift in 4H-SiC MOSFETs at Room and Cryogenic-Temperature. - Fabrizio Masin; Carlo De Santi; Arno Stockman; J. Lettens; F. Geenen; Gaudenzio Meneghesso; Enrico Zanoni; Peter Moens; Matteo Meneghini (IRPS, 2022)

$ mathrm{R}_{ text{ON}}$ and $ mathrm{V}_{ text{TH}}$ Extraction in Hard-Switched E-mode GaN HEMTs: Impact of Passivation and Layout. - Davide Favero; Carlo De Santi; Arno Stockman; Arianna Nardo; Piet Vanmeerbeek; Marnix Tack; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (IRPS, 2024)

Vth and Ron Instability of GaN Power HEMTs with pGaN Gate Under Negative Gate Bias. - S. L. Longato; Davide Favero; Arno Stockman; Arianna Nardo; Piet Vanmeerbeek; Marnix Tack; Gaudenzio Meneghesso; Enrico Zanoni; C. De Santi; Matteo Meneghini (IRPS, 2025)