Applications of DCIV method to NBTI characterization. - Arnost Neugroschel; Gennadi Bersuker; Rino Choi (Microelectron. Reliab., 2007)

Electrical characterization and analysis techniques for the high-kappa era. - Chadwin D. Young; Dawei Heh; Arnost Neugroschel; Rino Choi; Byoung Hun Lee; Gennadi Bersuker (Microelectron. Reliab., 2007)