A Dependable Processor by Using Built-in Self Test to Tolerate Periodical Transient Faults under Highly Electromagnetic Environment. - Aromhack Saysanasongkham; Masahiko Negishi; Masayuki Arai; Satoshi Fukumoto (PRDC, 2012)

An adaptive approach to dependable circuits for a digital power control. - Aromhack Saysanasongkham; Kenta Imai; Masayuki Arai; Satoshi Fukumoto; Keiji Wada (DSN, 2013)

Hybrid ARQ for DC-DC Converter Noise in Controller Area Networks. - Muneyuki Nakamura; Mamoru Ohara; Aromhack Saysanasongkham; Masayuki Arai; Kazuya Sakai; Satoshi Fukumoto (ICPP Workshops, 2014)

A Dual-FPGA Architecture with Rejuvenation for Realtime Applications. - Aromhack Saysanasongkham; Satoshi Fukumoto (PRDC, 2015)

The Reliability Analysis of the 1-out-of-2 System in Which Two Modules Do Mutual Cooperation in Recovery Mode. - Aromhack Saysanasongkham; Satoshi Fukumoto (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2016)

Fault masking issue on a dependable processor using BIST under highly electromagnetic environment. - Aromhack Saysanasongkham; Satoshi Fukumoto; Masayuki Arai (Int. J. Comput. Sci. Eng., 2017)