Diagnosis of Power Quality Events Based on Detrended Fluctuation Analysis. - Santanu Das; Arpan Kumar Pradhan; Ayush Kedia; Sovan Dalai; Biswendu Chatterjee; Sivaji Chakravorti (IEEE Trans. Ind. Electron., 2018)

Estimation of Contamination Level of Overhead Insulators Based on Surface Leakage Current Employing Detrended Fluctuation Analysis. - Suhas Deb; Santanu Das; Arpan Kumar Pradhan; Apu Banik; Biswendu Chatterjee; Sovan Dalai (IEEE Trans. Ind. Electron., 2020)