Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation. - Tommaso Cilento; Chan-Su Yun; Arsen Terterian; Chang Hwi Lee; Jung Eon Moon; Si Woo Lee; Hyoungcheol Kwon; Manho Seung; Seokkiu Lee (Microelectron. Reliab., 2018)