Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology. - Riaz Naseer; Jeff Draper; Younes Boulghassoul; Sandeepan DasGupta; Art Witulski (ACM Great Lakes Symposium on VLSI, 2007)

Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM. - Riaz Naseer; Younes Boulghassoul; Jeff Draper; Sandeepan DasGupta; Art Witulski (ISCAS, 2007)