Electrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators. - Artemisia Tsiara; S. A. Srinivasan; S. Balakrishnan 002; Marianna Pantouvaki; Philippe Absil; Joris Van Campenhout; Kris Croes (OFC, 2020)

Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon. - Ping-Yi Hsieh; Artemisia Tsiara; Barry J. O'Sullivan; Didit Yudistira; Marina Baryshnikova; Guido Groeseneken; Bernardette Kunert; Marianna Pantouvaki; Joris Van Campenhout; Ingrid De Wolf (IRPS, 2022)

Degradation mechanisms in Germanium Electro-Absorption Modulators. - Artemisia Tsiara; Alicja Lesniewska; Philippe Roussel; Srinivasan Ashwyn Srinivasan; Mathias Berciano; Marko Simicic; Marianna Pantouvaki; Joris Van Campenhout; Kristof Croes (IRPS, 2022)

Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors. - Kristof Croes; Veerle Simons; Brecht Truijen; Philippe Roussel; Koen Van Sever; Artemisia Tsiara; Jacopo Franco; Philippe Absil (OFC, 2022)

Modeling Dark Current Degradation of Monolithic InGaAs/GaAs-On-Si Nano-Ridge Photodetectors. - Ping-Yi Hsieh; Ameni Ben Driss; Artemisia Tsiara; Barry J. O'Sullivan; Didit Yudistira; Bernardette Kunert; Joris Van Campenhout; Ingrid De Wolf (IRPS, 2024)

Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors. - S. Musibau; N. Poumpouridis; Artemisia Tsiara; J. Franco; Mathias Berciano; Joris Van Campenhout; I. De Wout; K. Crees (IRPS, 2024)

Lifetime Model for Enabling Reliable InGaAs/GaAs Nano-Ridge Lasers Monolithically Integrated on 300 mm Silicon. - Ping-Yi Hsieh; Artemisia Tsiara; Barry J. O'Sullivan; Sara El Akel; Huseyin Sar; Debi Prasad Panda; Peter Swekis; Didit Yudistira; Bernardette Kunert; Joris Van Campenhout; Ingrid De Wolf (OFC, 2025)