The development of poled polyimide dielectric layers for simultaneous testing and light guiding applications in MCM-Ds. - Deborah M. Mechtel; Harry K. Charles Jr.; Arthur S. Francomacaro (Microelectron. Reliab., 2001)

Wirebonding at higher ultrasonic frequencies: reliability and process implications. - Harry K. Charles Jr.; K. J. Mach; S. J. Lehtonen; Arthur S. Francomacaro; J. S. DeBoy; R. L. Edwards (Microelectron. Reliab., 2003)

Surface micromachining in Silicon on Sapphire CMOS technology. - Francisco Tejada; Andreas G. Andreou; Dennis K. Wickenden; Arthur S. Francomacaro (ISCAS (4), 2004)