Test chips for die stress characterization using arrays of CMOS sensors. - Arthur T. Bradley; Richard C. Jaeger; Jeffrey C. Suhling; Y. Zou (CICC, 1999)

CMOS stress sensors on [100] silicon. - Richard C. Jaeger; Jeffrey C. Suhling; Ramanathan Ramani; Arthur T. Bradley; Jianping Xu (IEEE J. Solid State Circuits, 2000)