Micromachined probes for on-wafer measurement of millimeter- and submillimeter-wave devices and components. - Robert M. Weikle; N. Scott Barker; Arthur W. Lichtenberger; Matthew F. Bauwens (GlobalSIP, 2013)

Silicon-on-Insulator Substrates as a Micromachining Platform for Advanced Terahertz Circuits. - N. Scott Barker; Matthew F. Bauwens; Arthur W. Lichtenberger; Robert M. Weikle (Proc. IEEE, 2017)

Micromachined probes with integrated GaAs Schottky diodes for on-wafer temperature sensing. - Linli Xie; Christopher M. Moore; Michael E. Cyberey; Souheil Nadri; Noah D. Sauber; Matthew F. Bauwens; Arthur W. Lichtenberger; N. Scott Barker; Robert M. Weikle (I2MTC, 2018)