Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. - Artur Ghukasyan; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (VTS, 2023)

Testing for Electromigration in Sub-5-nm FinFET Memories. - Mahta Mayahinia; Mehdi Baradaran Tahoori; Grigor Tshagharyan; Karen Amirkhanyan; Artur Ghukasyan; Gurgen Harutyunyan; Yervant Zorian (IEEE Des. Test, 2024)