Fault Diagnosis in Designs with Convolutional Compactors. - Grzegorz Mrugalski; Chen Wang 014; Artur Pogiel; Jerzy Tyszer; Janusz Rajski (ITC, 2004)

Convolutional compaction-driven diagnosis of scan failures. - Grzegorz Mrugalski; Artur Pogiel; Janusz Rajski; Jerzy Tyszer; Chen Wang 014 (ETS, 2005)

Diagnosis with convolutional compactors in presence of unknown states. - Grzegorz Mrugalski; Artur Pogiel; Janusz Rajski; Jerzy Tyszer (ITC, 2005)

Convolutional Compactors with Variable Polynomials. - Artur Pogiel; Janusz Rajski; Jerzy Tyszer (ETS, 2006)

Isolation of Failing Scan Cells through Convolutional Test Response Compaction. - Grzegorz Mrugalski; Janusz Rajski; Chen Wang 014; Artur Pogiel; Jerzy Tyszer (J. Electron. Test., 2007)

Fault Diagnosis With Convolutional Compactors. - Grzegorz Mrugalski; Artur Pogiel; Janusz Rajski; Jerzy Tyszer (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007)

High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST. - Nilanjan Mukherjee 001; Artur Pogiel; Janusz Rajski; Jerzy Tyszer (ITC, 2008)

Fault diagnosis for embedded read-only memories. - Nilanjan Mukherjee 001; Artur Pogiel; Janusz Rajski; Jerzy Tyszer (ITC, 2009)

High-Speed On-Chip Event Counters for Embedded Systems. - Nilanjan Mukherjee 001; Artur Pogiel; Janusz Rajski; Jerzy Tyszer (VLSI Design, 2009)

High Volume Diagnosis in Memory BIST Based on Compressed Failure Data. - Nilanjan Mukherjee 001; Artur Pogiel; Janusz Rajski; Jerzy Tyszer (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010)

Fault Diagnosis in Memory BIST Environment with Non-march Tests. - Grzegorz Mrugalski; Artur Pogiel; Nilanjan Mukherjee 001; Janusz Rajski; Jerzy Tyszer; Pawel Urbanek (Asian Test Symposium, 2011)

Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. - Brady Benware; Grzegorz Mrugalski; Artur Pogiel; Janusz Rajski; Jedrzej Solecki; Jerzy Tyszer (ETS, 2011)

Ring Generator: An Ultimate Linear Feedback Shift Register. - Nilanjan Mukherjee 001; Janusz Rajski; Grzegorz Mrugalski; Artur Pogiel; Jerzy Tyszer (Computer, 2011)

Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. - Brady Benware; Grzegorz Mrugalski; Artur Pogiel; Janusz Rajski; Jedrzej Solecki; Jerzy Tyszer (J. Electron. Test., 2011)

BIST-Based Fault Diagnosis for Read-Only Memories. - Nilanjan Mukherjee 001; Artur Pogiel; Janusz Rajski; Jerzy Tyszer (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011)

High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs. - Maciej Trawka; Grzegorz Mrugalski; Nilanjan Mukherjee 001; Artur Pogiel; Janusz Rajski; Jakub Janicki; Jerzy Tyszer (ATS, 2014)

Quality assurance in memory built-in self-test tools. - Albert Au; Artur Pogiel; Janusz Rajski; Piotr Sydow; Jerzy Tyszer; Justyna Zawada (DDECS, 2014)

ROM fault diagnosis for O(n2) test algorithms. - Artur Pogiel; Janusz Rajski; Jerzy Tyszer (ETS, 2017)

Convolutional Compaction-Based MRAM Fault Diagnosis. - Bartosz Grzelak; Martin Keim; Artur Pogiel; Janusz Rajski; Jerzy Tyszer (ETS, 2021)

LBIST for Automotive ICs With Enhanced Test Generation. - Bartosz Kaczmarek; Grzegorz Mrugalski; Nilanjan Mukherjee 001; Artur Pogiel; Janusz Rajski; Lukasz Rybak 001; Jerzy Tyszer (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Power-Aware Test Scheduling for Memory BIST. - Albert Au; Michal Kçpinski; Makary Orczyk; Artur Pogiel (ITC, 2024)

Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. - Jaehoon Lee; Hyeonuk Son; Seohyun Kang; Dahyun Kang; Dongkwan Han; Jongsin Yun; Artur Pogiel; Etienne Racine; Krzysztof Jurga; Lori Schramm; Martin Keim (ITC, 2024)

Holistic Memory DFT Partitioning Using a Convolution-Based Algorithm. - Olivier Romain; Wojciech Gierszal; Luc Romain; Artur Pogiel (ETS, 2025)

Periodic Non-Destructive Memory BIST for Automotive Applications. - Wei Zou; Artur Pogiel; Albert Au; Martin Keim (VTS, 2025)