Reliability Analysis for Laptop Computer Under Electrical Harmonics. - Luis Carlos Méndez-González; Manuel Iván Rodríguez-Borbón; Manuel R. Piña-Monarrez; Roberto Ambrosio; Arturo Del Valle (Qual. Reliab. Eng. Int., 2016)

Reliability Model for Electronic Devices under Time Varying Voltage. - Luis Carlos Méndez-González; Manuel Iván Rodríguez-Borbón; Delia J. Valles-Rosales; Arturo Del Valle; Arnoldo Rodriguez (Qual. Reliab. Eng. Int., 2016)

Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution. - Luis Alberto Rodríguez-Picón; Luis Carlos Méndez-González; Manuel Iván Rodríguez-Borbón; Arturo Del Valle (Qual. Reliab. Eng. Int., 2016)