Bayesian estimation based on trimmed samples from Pareto populations. - Arturo J. Fernández (Comput. Stat. Data Anal., 2006)

Bounding maximum likelihood estimates based on incomplete ordered data. - Arturo J. Fernández (Comput. Stat. Data Anal., 2006)

Reliability inference and sample-size determination under double censoring for some two-parameter models. - Arturo J. Fernández (Comput. Stat. Data Anal., 2008)

Two-sided tolerance intervals in the exponential case: Corrigenda and generalizations. - Arturo J. Fernández (Comput. Stat. Data Anal., 2010)

Tolerance Limits for k -Out-of- n Systems With Exponentially Distributed Component Lifetimes. - Arturo J. Fernández (IEEE Trans. Reliab., 2010)

Design of progressively censored group sampling plans for Weibull distributions: An optimization problem. - Arturo J. Fernández; Carlos J. Pérez-González; Muhammad Aslam 002; Chi-Hyuck Jun (Eur. J. Oper. Res., 2011)

Optimal Reliability Demonstration Test Plans for $k$-out-of-$n$ Systems of Gamma Distributed Components. - Arturo J. Fernández (IEEE Trans. Reliab., 2011)

Optimal acceptance sampling plans for log-location-scale lifetime models using average risks. - Arturo J. Fernández; Carlos J. Pérez-González (Comput. Stat. Data Anal., 2012)

Minimizing the area of a Pareto confidence region. - Arturo J. Fernández (Eur. J. Oper. Res., 2012)

Generalized beta prior models on fraction defective in reliability test planning. - Arturo J. Fernández; Carlos J. Pérez-González (J. Comput. Appl. Math., 2012)

Smallest Pareto confidence regions and applications. - Arturo J. Fernández (Comput. Stat. Data Anal., 2013)

Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis. - Carlos J. Pérez-González; Arturo J. Fernández (Comput. Stat., 2013)

Computing optimal confidence sets for Pareto models under progressive censoring. - Arturo J. Fernández (J. Comput. Appl. Math., 2014)

Optimal Defects-Per-Unit Acceptance Sampling Plans Using Truncated Prior Distributions. - Arturo J. Fernández (IEEE Trans. Reliab., 2014)

Optimal schemes for resubmitted lot acceptance using previous defect count data. - Arturo J. Fernández (Comput. Ind. Eng., 2015)

Optimum attributes component test plans for k-out-of-n: F Weibull systems using prior information. - Arturo J. Fernández (Eur. J. Oper. Res., 2015)

Economic lot sampling inspection from defect counts with minimum conditional value-at-risk. - Arturo J. Fernández (Eur. J. Oper. Res., 2017)

Optimal attribute sampling plans in closed-forms. - Arturo J. Fernández (Comput. Ind. Eng., 2019)

Improved time-censored reliability test plans for k-out-of-n gamma systems. - Arturo J. Fernández; Carlos J. Pérez-González; Akram Kohansal (J. Comput. Appl. Math., 2019)

Explicit lot inspection by attributes using minimal prior information. - Arturo J. Fernández (Comput. Ind. Eng., 2020)

Balancing producer and consumer risks in optimal attribute testing: A unified Bayesian/Frequentist design. - Arturo J. Fernández; Cristian D. Correa-Álvarez; Luis R. Pericchi (Eur. J. Oper. Res., 2020)

Efficient truncated repetitive lot inspection using Poisson defect counts and prior information. - Carlos J. Pérez-González; Arturo J. Fernández; Akram Kohansal (Eur. J. Oper. Res., 2020)

Optimal durations of Weibull reliability tests based on failure counts. - Arturo J. Fernández (Comput. Ind. Eng., 2021)

Optimal lot sentencing based on defective counts and prior acceptability. - Arturo J. Fernández; Carlos J. Pérez-González; M. Mercedes Suárez-Rancel (J. Comput. Appl. Math., 2021)

Enhanced Lot Acceptance Testing Based on Defect Counts and Posterior Odds Ratios. - Arturo J. Fernández (Axioms, 2022)

Planning reliability demonstration tests with limited expected risks. - Arturo J. Fernández (Comput. Ind. Eng., 2022)

Joint Prediction for Future Failures Times Under Type-II Censoring. - S. F. Bagheri; Akbar Asgharzadeh; Arturo J. Fernández; Carlos J. Pérez-González (IEEE Trans. Reliab., 2022)

Gamma Reliability Test Times With Minimal Costs and Limited Risks. - Arturo J. Fernández (IEEE Trans. Reliab., 2022)

Optimal Confidence Regions for Weibull Parameters and Quantiles under Progressive Censoring. - Arturo J. Fernández (Algorithms, 2023)

Optimum lot inspection based on lognormal reliability tests. - Arturo J. Fernández (Int. J. Prod. Res., 2023)

Tolerance Limits and Sample-Size Determination Using Weibull Trimmed Data. - Arturo J. Fernández (Axioms, 2023)

Optimal repetitive reliability inspection of manufactured lots for lifetime models using prior information. - Carlos J. Pérez-González; Arturo J. Fernández; Vicent Giner-Bosch; Andrés Carrión-García (Int. J. Prod. Res., 2023)

Overdispersion Effects on Reliability Test Planning. - Arturo J. Fernández; Carlos J. Pérez-González; Andrés Carrión-García; Vicent Giner-Bosch (IEEE Trans. Reliab., 2023)

Computation of minimum-size confidence sets for one and two Weibull reliability levels. - Arturo J. Fernández (Comput. Ind. Eng., 2025)

Bayesian credible regions for two-parameter exponential distributions under type-II censoring. - Ali Saadati Nik; Akbar Asgharzadeh; Arturo J. Fernández (J. Comput. Appl. Math., 2025)