Software transformations for sequential test generation. - Arun Balakrishnan; Srimat T. Chakradhar (Asian Test Symposium, 1995)

Partial scan design for technology mapped circuits. - Arun Balakrishnan; Srimat T. Chakradhar (VLSI Design, 1995)

An exact algorithm for selecting partial scan flip-flops. - Srimat T. Chakradhar; Arun Balakrishnan; Vishwani D. Agrawal (J. Electron. Test., 1995)

Sequential Circuits with combinational Test Generation Complexity. - Arun Balakrishnan; Srimat T. Chakradhar (VLSI Design, 1996)

Retiming with logic duplication transformation: theory and an application to partial scan. - Arun Balakrishnan; Srimat T. Chakradhar (VLSI Design, 1996)

Peripheral Partitioning and Tree Decomposition for Partial Scan. - Arun Balakrishnan; Srimat T. Chakradhar (VLSI Design, 1998)

Requirements-Based Dynamic Metrics In Object-Oriented Systems. - Jane Cleland-Huang; Carl K. Chang; Hosung Kim; Arun Balakrishnan (RE, 2001)

Optimal eigenbeamforming for suppressing self-interference in full-duplex MIMO relays. - Taneli Riihonen; Arun Balakrishnan; Katsuyuki Haneda; Shurjeel Wyne; Stefan Werner 001; Risto Wichman (CISS, 2011)