Failure Analysis for Full-Scan Circuits. - Kaushik De; Arun Gunda (ITC, 1995)

Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions. - Narendra Devta-Prasanna; Sudhakar M. Reddy; Arun Gunda; P. Krishnamurthy; Irith Pomeranz (Asian Test Symposium, 2005)

Should Illinois-Scan Based Architectures be Centralized or Distributed? - Ahmad A. Al-Yamani; Narendra Devta-Prasanna; Arun Gunda (DFT, 2005)

A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals. - Narendra Devta-Prasanna; Arun Gunda; P. Krishnamurthy; Sudhakar M. Reddy; Irith Pomeranz (ICCD, 2005)

Methods for improving transition delay fault coverage using broadside tests. - Narendra Devta-Prasanna; Arun Gunda; P. Krishnamurthy; Sudhakar M. Reddy; Irith Pomeranz (ITC, 2005)

Test Generation for Open Defects in CMOS Circuits. - Narendra Devta-Prasanna; Arun Gunda; P. Krishnamurthy; Sudhakar M. Reddy; Irith Pomeranz (DFT, 2006)

A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. - Narendra Devta-Prasanna; Arun Gunda; P. Krishnamurthy; Sudhakar M. Reddy; Irith Pomeranz (ETS, 2006)

Systematic Scan Reconfiguration. - Ahmad A. Al-Yamani; Narendra Devta-Prasanna; Arun Gunda (ASP-DAC, 2007)

Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. - Ahmad A. Al-Yamani; Narendra Devta-Prasanna; Erik Chmelar; M. Grinchuk; Arun Gunda (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007)

Comparative study of centralised and distributed compatibility-based test data compression. - Ahmad A. Al-Yamani; Narendra Devta-Prasanna; Arun Gunda (IET Comput. Digit. Tech., 2008)

Accurate measurement of small delay defect coverage of test patterns. - Narendra Devta-Prasanna; Sandeep Kumar Goel; Arun Gunda; Mark Ward; P. Krishnamurthy (ITC, 2009)

Clock Gate Test Points. - Narendra Devta-Prasanna; Arun Gunda (ITC, 2010)

Multiple fault activation cycle tests for transistor stuck-open faults. - Narendra Devta-Prasanna; Arun Gunda; Sudhakar M. Reddy; Irith Pomeranz (ITC, 2010)

Silicon evaluation of faster than at-speed transition delay tests. - Sreejit Chakravarty; Narendra Devta-Prasanna; Arun Gunda; Junxia Ma; Fan Yang 060; H. Guo; R. Lai; D. Li (VTS, 2012)

Silicon Evaluation of Cell-Aware ATPG Tests and Small Delay Tests. - Fan Yang 060; Sreejit Chakravarty; Arun Gunda; Nicole Wu; Jianyu Ning (ATS, 2014)