Efficiency Measurement Method for Fully Integrated Voltage Regulators used in 4th and 5th Generation Intel® Core™ Microprocessors. - Gerhard Schrom; Michael J. Hill; Sarath Makala; Ravi Sankar Vunnam; Arun Krishnamoorthy; Ryan Ferguson (ITC, 2019)

High-Volume Testing and DC Offset Trimming Technique of On-Die Bandgap Voltage Reference for SOCs and Microprocessors. - Takao Oshita; Jonathan Douglas; Arun Krishnamoorthy (IEEE Trans. Very Large Scale Integr. Syst., 2019)