An on-chip ADC BIST solution and the BIST enabled calibration scheme. - Xiankun Jin; Tao Chen 006; Mayank Jain; Arun Kumar Barman; David Kramer; Doug Garrity; Randall L. Geiger; Degang Chen 001 (ITC, 2017)

A 14-bit 6.7 MS/s 0.018 mm2 98 μW SAR A/D Converter With On-the-Fly Autocalibration for Array Applications. - Sanjoy Kumar Dey; Arun Kumar Barman; Pawan Sehgal; Mukul Sarkar; Shouribrata Chatterjee (IEEE Trans. Very Large Scale Integr. Syst., 2025)