On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm Scaled CMOS Circuits Based on Newton-Raphson Method. - Ashesh Rastogi; Wei Chen; Sandip Kundu (DAC, 2007)

A Study on Impact of Leakage Current on Dynamic Power. - Ashesh Rastogi; Kunal P. Ganeshpure; Sandip Kundu (ISCAS, 2007)

An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect. - Ashesh Rastogi; Wei Chen; Alodeep Sanyal; Sandip Kundu (VLSI Design, 2007)

On Composite Leakage Current Maximization. - Ashesh Rastogi; Kunal P. Ganeshpure; Alodeep Sanyal; Sandip Kundu (J. Electron. Test., 2008)

An Efficient Technique for Leakage Current Estimation in Nanoscaled CMOS Circuits Incorporating Self-Loading Effects. - Alodeep Sanyal; Ashesh Rastogi; Wei Chen; Sandip Kundu (IEEE Trans. Computers, 2010)