Compaction-based test generation using state and fault information. - Ashish Giani; Shuo Sheng; Michael S. Hsiao; Vishwani D. Agrawal (Asian Test Symposium, 2000)

Efficient spectral techniques for sequential ATPG. - Ashish Giani; Shuo Sheng; Michael S. Hsiao; Vishwani D. Agrawal (DATE, 2001)

Novel Spectral Methods for Built-In Self-Test in a System-on-a-Chip Environment. - Ashish Giani; Shuo Sheng; Michael S. Hsiao; Vishwani D. Agrawal (VTS, 2001)

State and Fault Information for Compaction-Based Test Generation. - Ashish Giani; Shuo Sheng; Michael S. Hsiao; Vishwani D. Agrawal (J. Electron. Test., 2002)