Systematic Study of Process Impact on FinFET Reliability. - Rakesh Ranjan; Ki-Don Lee; Md Iqbal Mahmud; Mohammad Shahriar Rahman; Pavitra Ramadevi Perepa; Charles Briscoe LaRow; Caleb Dongkyun Kwon; Maihan Nguyen; Minhyo Kang; Ashish Kumar Jha 005; Ahmed Shariq; Shamas Musthafa Ummer; et al. (IRPS, 2021)

A Systematic Study of HCI Improvement in FinFET with Source/Drain Implant and Geometry Modulation. - Rakesh Ranjan; Pavitra R. Perepa; Ki-Don Lee; Ashish Kumar Jha 005; Kartika Chandra Sahoo; Kayla N. Sanders; Robert Moeller; Prateek Sharma; Minhyo Kang; Peter Kim; Kwanjae Song; Yongwoo Jeon; et al. (IRPS, 2024)