Fault-based automatic test generator for linear analog circuits. - Naveena Nagi; Abhijit Chatterjee; Ashok Balivada; Jacob A. Abraham (ICCAD, 1993)

Efficient multisine testing of analog circuits. - Naveena Nagi; Abhijit Chatterjee; Ashok Balivada; Jacob A. Abraham (VLSI Design, 1995)

Verification of transient response of linear analog circuits. - Ashok Balivada; Yatin Vasant Hoskote; Jacob A. Abraham (VTS, 1995)

A novel test generation approach for parametric faults in linear analog circuits . - Hong Helena Zheng; Ashok Balivada; Jacob A. Abraham (VTS, 1996)

Analog Testing with Time Response Parameters. - Ashok Balivada; Jin Chen; Jacob A. Abraham (IEEE Des. Test Comput., 1996)

A unified approach for fault simulation of linear mixed-signal circuits. - Ashok Balivada; Hong Zheng; Naveena Nagi; Abhijit Chatterjee; Jacob A. Abraham (J. Electron. Test., 1996)

A Workload Based Lookup Table for Minimal Power Operation Under Supply and Body Bias Control. - K. Sreejith; Bharadwaj Amrutur; Ashok Balivada (J. Low Power Electron., 2009)