Inline nondestructive internal disorder detection in pear fruit using explainable deep anomaly detection on X-ray images. - Tim Van De Looverbosch; Jiaqi He; Astrid Tempelaere; Klaas Kelchtermans; Pieter Verboven; Tinne Tuytelaars; Jan Sijbers; Bart M. Nicolaï (Comput. Electron. Agric., 2022)

Deep Learning for Apple Fruit Quality Inspection using X-Ray Imaging. - Astrid Tempelaere; Leen Van Doorselaer; Jiaqi He; Pieter Verboven; Tinne Tuytelaars; Bart M. Nicolaï (ICCV (Workshops), 2023)

Non-destructive internal disorder segmentation in pear fruit by X-ray radiography and AI. - Astrid Tempelaere; Hoang Minh Phan; Tim Van De Looverbosch; Pieter Verboven; Bart M. Nicolaï (Comput. Electron. Agric., 2023)

Unsupervised anomaly detection for pome fruit quality inspection using X-ray radiography. - Astrid Tempelaere; Jiaqi He; Leen Van Doorselaer; Pieter Verboven; Bart M. Nicolaï; Mario Valerio Giuffrida (Comput. Electron. Agric., 2024)