On modeling impact of sub-wavelength lithography on transistors. - Aswin Sreedhar; Sandip Kundu (ICCD, 2007)

On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits. - Aswin Sreedhar; Alodeep Sanyal; Sandip Kundu (DATE, 2008)

Modeling and analysis of non-rectangular transistors caused by lithographic distortions. - Aswin Sreedhar; Sandip Kundu (ICCD, 2008)

Statistical Yield Modeling for Sub-wavelength Lithography. - Aswin Sreedhar; Sandip Kundu (ITC, 2008)

Lithography Simulation Basics and a Study on Impact of Lithographic Process Window on Gate and Path Delays. - Aswin Sreedhar; Sandip Kundu (J. Low Power Electron., 2008)

On linewidth-based yield analysis for nanometer lithography. - Aswin Sreedhar; Sandip Kundu (DATE, 2009)

Optical lithography simulation using wavelet transform. - Rance Rodrigues; Aswin Sreedhar; Sandip Kundu (ICCD, 2009)

Statistical timing analysis based on simulation of lithographic process. - Aswin Sreedhar; Sandip Kundu (ICCD, 2009)

TURBONFS: turbo nand flash search. - Shruti Vyas; Aswin Sreedhar; Sandip Kundu (ACM Great Lakes Symposium on VLSI, 2010)

Modeling manufacturing process variation for design and test. - Sandip Kundu; Aswin Sreedhar (DATE, 2011)

On design of test structures for lithographic process corner identification. - Aswin Sreedhar; Sandip Kundu (DATE, 2011)

Physically unclonable functions for embeded security based on lithographic variation. - Aswin Sreedhar; Sandip Kundu (DATE, 2011)

On discovery of "missing" physical design rules via diagnosis of soft-faults. - Aswin Sreedhar; Sandip Kundu (ISQED, 2011)

On Reliability Trojan Injection and Detection. - Aswin Sreedhar; Sandip Kundu; Israel Koren (J. Low Power Electron., 2012)