Reduction of White Spot Defects in CMOS Image Sensors Fabricated Using Epitaxial Silicon Wafer with Proximity Gettering Sinks by CH2P Molecular Ion Implantation. - Takeshi Kadono; Ryo Hirose; Ayumi Onaka-Masada; Koji Kobayashi; Akihiro Suzuki; Ryosuke Okuyama; Yoshihiro Koga; Atsuhiko Fukuyama; Kazunari Kurita (Sensors, 2022)