Data-Aware Partial ECC with Data Modulation of ReRAM with Non-volatile In-memory Computing for Image Recognition with Deep Neural Network. - Atsuna Hayakawa; Toshiki Nakamura; Yoshiaki Deguchi; Kazuki Maeda; Ken Takeuchi (ISCAS, 2018)

Comprehensive Analysis of Data-Retention and Endurance Trade-Off of 40nm TaOx-based ReRAM. - Shouhei Fukuyama; Atsuna Hayakawa; Ryutaro Yasuhara; Shinpei Matsuda; Hiroshi Kinoshita; Ken Takeuchi (IRPS, 2019)

3-D NAND Flash Value-Aware SSD: Error-Tolerant SSD Without ECCs for Image Recognition. - Yoshiaki Deguchi; Toshiki Nakamura; Atsuna Hayakawa; Ken Takeuchi (IEEE J. Solid State Circuits, 2019)