Evaluation of the statistical delay quality model. - Yasuo Sato; Shuji Hamada; Toshiyuki Maeda; Atsuo Takatori; Seiji Kajihara (ASP-DAC, 2005)

Invisible delay quality - SDQM model lights up what could not be seen. - Yasuo Sato; Shuji Hamada; Toshiyuki Maeda; Atsuo Takatori; Yasuyuki Nozuyama; Seiji Kajihara (ITC, 2005)

Recognition of Sensitized Longest Paths in Transition Delay Test. - Shuji Hamada; Toshiyuki Maeda; Atsuo Takatori; Yasuyuki Noduyama; Yasuo Sato (ITC, 2006)

A Statistical Quality Model for Delay Testing. - Yasuo Sato; Shuji Hamada; Toshiyuki Maeda; Atsuo Takatori; Seiji Kajihara (IEICE Trans. Electron., 2006)