7.7 Enterprise-grade 6x fast read and 5x highly reliable SSD with TLC NAND-flash memory for big-data storage. - Tsukasa Tokutomi; Masafumi Doi; Shogo Hachiya; Atsuro Kobayashi; Shuhei Tanakamaru; Ken Takeuchi (ISSCC, 2015)

Versatile TLC NAND flash memory control to reduce read disturb errors by 85% and extend read cycles by 6.7-times of Read-Hot and Cold data for cloud data centers. - Atsuro Kobayashi; Tsukasa Tokutomi; Ken Takeuchi (VLSI Circuits, 2016)

12× bit-error acceptable, 300× extended data-retention time, value-aware SSD with vertical 3D-TLC NAND flash memories for image recognition. - Yoshiaki Deguchi; Toshiki Nakamura; Atsuro Kobayashi; Ken Takeuchi (CICC, 2017)