An 8Mb multi-layered cross-point ReRAM macro with 443MB/s write throughput. - Akifumi Kawahara; Ryotaro Azuma; Yuuichirou Ikeda; Ken Kawai; Yoshikazu Katoh; Kouhei Tanabe; Toshihiro Nakamura; Yoshihiko Sumimoto; Naoki Yamada; Nobuyuki Nakai; Shoji Sakamoto; Yukio Hayakawa; et al. (ISSCC, 2012)

Filament scaling forming technique and level-verify-write scheme with endurance over 107 cycles in ReRAM. - Akifumi Kawahara; Ken Kawai; Yuuichirou Ikeda; Yoshikazu Katoh; Ryotaro Azuma; Yuhei Yoshimoto; Kouhei Tanabe; Zhiqiang Wei 005; Takeki Ninomiya; Koji Katayama; Ryutaro Yasuhara; Shunsaku Muraoka; et al. (ISSCC, 2013)

An 8 Mb Multi-Layered Cross-Point ReRAM Macro With 443 MB/s Write Throughput. - Akifumi Kawahara; Ryotaro Azuma; Yuuichirou Ikeda; Ken Kawai; Yoshikazu Katoh; Yukio Hayakawa; Kiyotaka Tsuji; Shinichi Yoneda; Atsushi Himeno; Kazuhiko Shimakawa; Takeshi Takagi; Takumi Mikawa; et al. (IEEE J. Solid State Circuits, 2013)

Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded application. - Yukio Hayakawa; Atsushi Himeno; Ryutaro Yasuhara; W. Boullart; E. Vecchio; T. Vandeweyer; T. Witters; D. Crotti; M. Jurczak; S. Fujii; S. Ito; Y. Kawashima; et al. (VLSIC, 2015)