A low capture power test generation method using capture safe test vectors. - Atsushi Hirai; Yukari Yamauchi; Toshinori Hosokawa; Masayuki Arai (ETS, 2015)

A dynamic test compaction method on low power test generation based on capture safe test vectors. - Toshinori Hosokawa; Atsushi Hirai; Hiroshi Yamazaki; Masayuki Arai (DFT, 2017)

A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation. - Toshinori Hosokawa; Atsushi Hirai; Yukari Yamauchi; Masayuki Arai (IEICE Trans. Inf. Syst., 2017)