Testing for a Solid-State Color Image Sensor. - T. Noguchi; Atsushi Murakami; Masato Kawai; Y. Hayasaka (ITC, 1986)

On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits. - Seiji Kajihara; Atsushi Murakami; Tomohisa Kaneko (Asian Test Symposium, 1999)

Selection of potentially testable path delay faults for test generation. - Atsushi Murakami; Seiji Kajihara; Tsutomu Sasao; Irith Pomeranz; Sudhakar M. Reddy (ITC, 2000)

On validating data hold times for flip-flops in sequential circuits. - Sudhakar M. Reddy; Irith Pomeranz; Seiji Kajihara; Atsushi Murakami; Sadami Takeoka; Mitsuyasu Ohta (ITC, 2000)