Pylon: Towards an integrated customizable volume diagnosis infrastructure. - Yan Pan; Rao Desineni; Kannan Sekar; Atul Chittora; Sherwin Fernandes; Neerja Bawaskar; John M. Carulli (ITC, 2016)

Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data. - Wu-Tung Cheng; Randy Klingenberg; Brady Benware; Wu Yang; Manish Sharma; Geir Eide; Yue Tian; Sudhakar M. Reddy; Yan Pan; Sherwin Fernandes; Atul Chittora (ATS, 2017)