Plasma FIB: Enlarge your field of view and your field of applications. - Audrey Garnier; Giuseppe Filoni; Tomas Hrncír; Lukas Hladík (Microelectron. Reliab., 2015)

Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach. - Emanuele Villa; Audrey Garnier; Antoine Reverdy (Microelectron. Reliab., 2018)