A novel fast and versatile temperature measurement system for LDMOS transistors. - Augusto Tazzoli; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2005)

Holding voltage investigation of advanced SCR-based protection structures for CMOS technology. - Augusto Tazzoli; Fabio Alessio Marino; Martina Cordoni; A. Benvenuti; Paolo Colombo; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2007)

Thermal storage effects on AlGaN/GaN HEMT. - Francesca Danesin; Augusto Tazzoli; Franco Zanon; Gaudenzio Meneghesso; Enrico Zanoni; Antonio Cetronio; Claudio Lanzieri; Simone Lavanga; Marco Peroni; Paolo Romanini (Microelectron. Reliab., 2008)

Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields. - Augusto Tazzoli; Gaudenzio Meneghesso; Franco Zanon; Francesca Danesin; Enrico Zanoni; Philippe Bove; R. Langer; J. Thorpe (Microelectron. Reliab., 2008)

Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test. - Nicolo Ronchi; Franco Zanon; Antonio Stocco; Augusto Tazzoli; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2009)

Breakdown characterization of gate oxides in 35 and 70 Å BCD8 smart power technology. - Augusto Tazzoli; Lorenzo Cerati; A. Andreini; Gaudenzio Meneghesso (Microelectron. Reliab., 2009)

Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism. - Jacopo Iannacci; A. Repchankova; Alessandro Faes; Augusto Tazzoli; Gaudenzio Meneghesso; Gian-Franco Dalla Betta (Microelectron. Reliab., 2010)

Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches. - Augusto Tazzoli; Marco Barbato; F. Mattiuzzo; V. Ritrovato; Gaudenzio Meneghesso (Microelectron. Reliab., 2010)

Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform. - Augusto Tazzoli; Martina Cordoni; Paolo Colombo; C. Bergonzoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2010)

Aluminum Nitride reconfigurable RF-MEMS front-ends. - Augusto Tazzoli; Matteo Rinaldi; Chengjie Zuo; Nipun Sinha; Jan Van der Spiegel; Gianluca Piazza (ASICON, 2011)

An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches. - Jacopo Iannacci; Alessandro Faes; A. Repchankova; Augusto Tazzoli; Gaudenzio Meneghesso (Microelectron. Reliab., 2011)

ESD sensitivity of a GaAs MMIC microwave power amplifier. - Augusto Tazzoli; Isabella Rossetto; Enrico Zanoni; Dai Yufeng; Tiziana Tomasi; Gaudenzio Meneghesso (Microelectron. Reliab., 2011)

K-band capacitive MEMS switches on GaAs substrate: Design, fabrication, and reliability. - Anna Persano; Augusto Tazzoli; Paola Farinelli; Gaudenzio Meneghesso; Pietro Siciliano; Fabio Quaranta (Microelectron. Reliab., 2012)

A -173 dBc/Hz @ 1 MHz offset Colpitts oscillator using AlN contour-mode MEMS resonator. - Jabeom Koo; Augusto Tazzoli; Jeronimo Segovai-Fernandez; Gianluca Piazza; Brian P. Otis (CICC, 2013)

Neurocomputing and associative memories based on ovenized aluminum nitride resonators. - Vehbi Calayir; Tom Jackson; Augusto Tazzoli; Gianluca Piazza; Larry T. Pileggi (IJCNN, 2013)