A Deterministic Model for Random Telegraph Noise. - Elias Ramos; Wilian Padilha; Augusto Weber; Fredy Morales; João B. Martins; Ricardo Reis 001 (LASCAS, 2025)

A New Metric for Estimating the Effects of Process Variability and Applications in Radiation-Tolerant Digital Circuits. - Elias Ramos; Augusto Weber; Wilian Padilha; João B. Martins; Ricardo Reis 001 (NewCAS, 2025)