Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs. - Rasik Rashid Malik; Vipin Joshi; Rajarshi Roy Chaudhuri; Mehak Ashraf Mir; Zubear Khan; Avinas N. Shaji; Madhura Bhattacharya; Anup T. Vitthal; Mayank Shrivastava (IRPS, 2023)