Lifetime evaluation for Hybrid-Drain-embedded Gate Injection Transistor (HD-GIT) under practical switching operations. - Ayanori Ikoshi; Masahiro Toki; Hiroto Yamagiwa; Daijiro Arisawa; Masahiro Hikita; Kazuki Suzuki; Manabu Yanagihara; Yasuhiro Uemoto; Kenichiro Tanaka; Tetsuzo Ueda (IRPS, 2018)