Concurrent optimization of process dependent variations in different circuit performance measures. - Ayhan A. Mutlu; Norman G. Gunther; Mahmud Rahman (ISCAS (4), 2003)

Statistical circuit performance variability minimization under manufacturing variations. - Ayhan A. Mutlu; Charles Kwong; Abir Mukherjee; Mahmud Rahman (ISCAS, 2006)

An Exploratory Study on Statistical Timing Analysis and Parametric Yield Optimization. - Ayhan A. Mutlu; Kelvin J. Le; Mustafa Celik; Dar-sun Tsien; Garry Shyu; Long-Ching Yeh (ISQED, 2007)

A parametric approach for handling local variation effects in timing analysis. - Ayhan A. Mutlu; Jiayong Le; Ruben Molina; Mustafa Celik (DAC, 2009)

Parametric analysis to determine accurate interconnect extraction corners for design performance. - Ayhan A. Mutlu; Jiayong Le; Ruben Molina; Mustafa Celik (ISQED, 2009)

Statistical Electromigration analysis of a chip with the consideration of a within-die temperature map. - Ted Sun; Ayhan A. Mutlu; Mahmud Rahman (ISCAS, 2013)

A new statistical methodology predicting chip failure probability considering electromigration. - Ted Sun; Ayhan A. Mutlu; Mahmudur Rahman (Microelectron. Reliab., 2013)