Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data. - Aymen Ladhar; Mohamed Masmoudi; Laroussi Bouzaida (DATE, 2009)

Analysis and diagnosis of multiple simultaneous defects. - Aymen Ladhar; Mohamed Masmoudi (ICECS, 2009)

A novel algorithm to extract open defects from industrial designs. - Aymen Ladhar; Mohamed Masmoudi (ICECS, 2009)

An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis. - Aymen Ladhar; Mohamed Masmoudi (J. Electron. Test., 2010)

Extraction and Simulation of Intra-gate Defects Affecting CMOS Libraries. - Aymen Ladhar; Mohamed Masmoudi (J. Comput., 2010)

Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip. - Safa Mhamdi; Arnaud Virazel; Patrick Girard 001; Alberto Bosio; Etienne Auvray; Eric Faehn; Aymen Ladhar (IOLTS, 2019)

Learning-Based Cell-Aware Defect Diagnosis of Customer Returns. - Safa Mhamdi; Patrick Girard 001; Arnaud Virazel; Alberto Bosio; Aymen Ladhar (ETS, 2020)

A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns. - Safa Mhamdi; Patrick Girard 001; Arnaud Virazel; Alberto Bosio; Aymen Ladhar (ITC, 2020)

A Learning-Based Methodology for Accelerating Cell-Aware Model Generation. - P. D'Hondt; Aymen Ladhar; Patrick Girard 001; Arnaud Virazel (DATE, 2021)

Cell-Aware Diagnosis of Customer Returns Using Bayesian Inference. - Safa Mhamdi; Patrick Girard 001; Arnaud Virazel; Alberto Bosio; Aymen Ladhar (ISQED, 2021)

A Comprehensive Learning-Based Flow for Cell-Aware Model Generation. - P. D'Hondt; Aymen Ladhar; Patrick Girard 001; Arnaud Virazel (ITC, 2022)

On Using Cell-Aware Methodology for SRAM Bit Cell Testing. - Xhesila Xhafa; Aymen Ladhar; Eric Faehn; Lorena Anghel; Gregory di Pendina; Patrick Girard 001; Arnaud Virazel (ETS, 2023)